The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

Jun. 10, 2014
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Friso Jedema, Eindhoven, NL;

Casper van der Avoort, Waalre, NL;

Stephan Heil, Eindhoven, NL;

Kim Phan Le, Eindhoven, NL;

Olaf Wunnicke, Eindhoven, NL;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/56 (2006.01); G01F 25/00 (2006.01);
U.S. Cl.
CPC ...
G01F 25/0007 (2013.01); G01F 1/56 (2013.01);
Abstract

A method and apparatus for measuring the rate of flow of an ion-containing fluid in a channel are disclosed herein. The apparatus includes a captive sensor operable to detect changes in capacitance value due to the deflection of the ions in the fluid by a magnetic field, and a processor operable to determine a flow speed of fluid from the detected change in capacitance value and a predetermined value of magnetic field strength. Such apparatus may be implemented using CMOS technology. The apparatus may operate in a magnetic field generated by a permanent magnet and measure the flow reliably.


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