The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Jul. 16, 2011
Dirk Mucha, Berlin, DE;
Timo Krueger, Berlin, DE;
Dirk Mucha, Berlin, DE;
Timo Krueger, Berlin, DE;
FIAGON GMBH, Berlin, DE;
Abstract
A method for checking situation and position data of an instrument with at least a first section having at least a first sensor and at least a second sensor. The method encompasses the metrological determination of the situation or position, or its change, of the first sensor and the second sensor, determining a variable feature of the spatial reference between the situation or position of the first sensor and the situation or position of the second sensor at least at a first point in time, at a second point in time and at a third point in time. The method further encompasses determining, by means of a criterion, whether a difference of the variable feature between a first expression at a first point in time and a second expression at a second point in time still exists at a third point in time.