The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

Oct. 07, 2014
Applicant:

Dr. Johannes Heidenhain Gmbh, Traunreut, DE;

Inventors:

Wolfgang Holzapfel, Obing, DE;

Jörg Drescher, Samerberg, DE;

Robert Kellner, Waging am See, DE;

Markus Meissner, Übersee, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/14 (2006.01); G01D 5/38 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); G01B 9/02049 (2013.01); G01B 9/02083 (2013.01); G01D 5/38 (2013.01);
Abstract

A position-measuring device for detecting the position of two objects movable relative to each other, includes a measuring standard that is joined to one of the two objects, as well as a scanning system for scanning the measuring standard, the scanning system being joined to the other of the two objects. The scanning system permits a simultaneous determination of position along a first lateral shift direction and along a vertical shift direction of the objects. To that end, on the part of the scanning system, two scanning beam paths are formed, in which a group of phase-shifted signals is able to be generated in each case at the output end from interfering partial beams of rays. In addition, via the scanning system, at least a third scanning beam path is formed, by which it is possible to determine position along a second lateral shift direction of the objects. The beam from a light source is able to be supplied to the scanning system via a first light guide and coupling-in optics in common for all three scanning beam paths. The interfering partial beams of rays produced in the three scanning beam paths are able to be coupled via common coupling-out optics, into a second light guide which supplies these beams of rays to a detector system.


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