The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Feb. 07, 2013
Ihi Corporation, Tokyo, JP;
Michiko Baba, Tokyo, JP;
Kouzou Hasegawa, Tokyo, JP;
Kiyofumi Fujimura, Tokyo, JP;
Toshihiro Hayashi, Tokyo, JP;
Norimasa Taga, Tokyo, JP;
IHI Corporation, Tokyo, JP;
Abstract
An inner diameter measuring device, comprising an image pickup unit () provided at a base end of a frame unit () and for picking up an image of a forward end side, a centering unit () provided at a forward end of the frame unit, a laser beam diffusing unit () provided on the centering unit and at a forward end side of the centering unit via a light transmitting window, a laser beam emitting unit () provided on a base end side of the centering unit, and a cone mirror () provided on the laser beam diffusing unit and having a conical reflection surface at a forward end, wherein a center line of the cone mirror coincides with an optical axis of the image pickup unit, and the centering unit is adapted to adjust a posture of the image pickup unit so that a laser beam () projected from the laser beam emitting unit enters a vertex of the cone mirror.