The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

Jul. 12, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Min Seok S Kim, Yongin-si, KR;

Jong-myeon Park, Incheon, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12N 5/09 (2010.01); C12N 15/10 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
C12N 5/0693 (2013.01); B01L 3/502753 (2013.01); C12N 15/1006 (2013.01); B01L 2200/0621 (2013.01); B01L 2200/16 (2013.01); B01L 2300/0803 (2013.01); B01L 2300/0864 (2013.01); B01L 2400/0409 (2013.01); B01L 2400/0677 (2013.01); B01L 2400/086 (2013.01);
Abstract

A micro fluidic apparatus includes a sample chamber that divides a sample into a first fluid layer and a second fluid layer due to a centrifugal force; a first enriching unit a that receives the first fluid layer from the sample chamber, forms a first complex of a first fine particle and the first target material, and separates the first complex from the first fluid layer using a density difference; and a second enriching unit that receives the second fluid layer from the sample chamber, forms a second complex of a second fine particle and the second target material, and separates the second complex from the second fluid layer using a density difference.


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