The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
May. 01, 2014
Applicant:
Worcester Polytechnic Institute, Worcester, MA (US);
Inventors:
Ki H. Chon, Worcester, MA (US);
Jowoon Chong, Worcester, MA (US);
Assignee:
Worcester Polytechnic Institute, Worcester, MA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/024 (2006.01); A61B 5/046 (2006.01);
U.S. Cl.
CPC ...
A61B 5/7282 (2013.01); A61B 5/02416 (2013.01); A61B 5/046 (2013.01); A61B 5/6898 (2013.01); A61B 5/02438 (2013.01); A61B 5/7264 (2013.01);
Abstract
Enhanced real-time realizable AF algorithm for accurate detection of, and discrimination between, NSR, AF, PVC, and PAC. The method of these teachings includes an AF detection method having a modified Poincare approach in order to differentiate various patterns of PAC and PVC from NSR and AF. The method of these teachings can also apply to the Kullback-Leibler divergence or the Turning Point Ratio (TPR) to differentiate between various patterns of PAC and PVC from NSR and AF.