The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Oct. 29, 2015
Nokia Solutions and Network Oy, Espoo, FI;
Bishwarup Mondal, Beavercreek, OH (US);
Xiaoyi Wang, Hoffman Estates, IL (US);
Nokia Solutions and Networks Oy, Espoo, FI;
Abstract
Indication(s) of a configuration of first interference measurement resources in first subframe(s) and of a configuration of second interference measurement resources in second subframe(s) are received at a first BS and from a second BS using an interface between the first and second BSs. The first BS transmits zero or low power REs that coincide with the REs belonging to the first interference measurement resources in the first subframe(s). The first BS transmits full power REs that coincide with the REs belonging to the second interference measurement resources in the second subframe(s). The first interference measurement resources in the first subframe(s) are to be used by a UE (e.g., attached to the second base station) to measure interference for zero or low power REs and the second interference measurement resources in the second subframe(s) are to be used by the UE to measure interference for full power REs.