The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Apr. 28, 2014
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Shohei Nakagata, Kawasaki, JP;

Ryuta Tanaka, Machida, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/40 (2014.01); H04N 19/86 (2014.01);
U.S. Cl.
CPC ...
H04N 19/86 (2014.11); H04N 19/40 (2014.11);
Abstract

An evaluation apparatus includes: a memory; and a processor coupled to the memory and configured to calculate a first feature by calculating a first-order difference for a first image, calculate a second feature by calculating a second-order difference for the first image, calculate a third feature by calculating a first-order difference for a second image, calculate a fourth feature by calculating a second-order difference for the second image, and evaluate deterioration of the second image with respect to the first image according to a first simultaneous distribution that represents a first relationship between the first feature and the second feature and to a second simultaneous distribution that represents a second relationship between the third feature and the fourth feature.


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