The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Jan. 07, 2014
Siemens Aktiengesellschaft, Munich, DE;
Michael Kelm, Erlangen, DE;
Felix Lugauer, Erlangen, DE;
Jingdan Zhang, Bellevue, WA (US);
Yefeng Zheng, Dayton, NJ (US);
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method and a segmentation system are disclosed. An embodiment of the method includes providing an image representation of the structure; providing a start surface model, including a mesh with a plurality of vertices connected by edges; defining for each vertex a ray normal to the surface model at the position of the vertex; assigning more than two labels to each vertex, each label representing a candidate position of the vertex on the ray; providing a representation of likelihoods for each candidate position the likelihood referring to whether the candidate position corresponds to a surface point of the structure in the image representation; and defining a first order Markow Random Field with discrete multivariate random variables, the random variables including the labels of the candidate positions and the representation of likelihoods, finding an optimal segmentation of the structure by using an maximum a posteriori estimation in this Markow Random Field.