The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Apr. 26, 2011
Judit Martinez Bauza, San Diego, CA (US);
Mashhour M. Solh, Alanta, GA (US);
Judit Martinez Bauza, San Diego, CA (US);
Mashhour M. Solh, Alanta, GA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
In general, techniques are described for determining a vision-based quality metric for three-dimensional (3D) video. A device () comprising a 3D analysis unit () may implement these techniques to compute a 3D objective metric (). The 3D analysis unit () estimates an ideal depth map () that would generate a distortion limited image view using DIBR-based 3D video data () and then derives one or more distortion metrics () based on quantitative comparison of the ideal depth map () and a depth map () used in the generation of the DIBR-based 3D video data (). Based on the derived one or more distortion metrics (), the 3D analysis unit () computes the objective metric () to quantify visual quality of DIBR-based video data (). The 3D objective metric () may be used to alter or otherwise adjust depth estimation and encoding/decoding parameters to correct for expected visual discomfort.
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