The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Apr. 21, 2014
Koninklijke Philips N.v., Eindhoven, NL;
Peter Prinsen, Eindhoven, NL;
Jens Wiegert, Aachen, DE;
Cristian Lorenz, Hamburg, DE;
Heike Ruppertshofen, Hamburg, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The invention relates to an apparatus () for calculating an x-ray dose distribution within an object for a computed tomography examination. A primary flux determination unit () determines firstly a primary flux distribution within the object, wherein then this determined primary flux distribution is used as an initial total flux distribution by a total flux determination unit () while applying a six-flux model algorithm. This allows the determination of the total flux distribution to start with a relatively good first approximation of the total flux distribution such that the six-flux model algorithm can determine the total flux distribution very fast. The determined total flux distribution is finally used by a dose distribution determination unit () for determining a total dose distribution. The apparatus allows therefore for a very fast determination of x-ray dose distributions for computed tomography examinations.