The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Jul. 23, 2014
Applicant:

Zijilai Innovative Services Co., Ltd., Shenzhen, CN;

Inventors:

Chih-Kuang Chang, New Taipei, TW;

Xin-Yuan Wu, Shenzhen, CN;

Yi Liu, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06T 19/20 (2011.01); G06T 17/20 (2006.01); G01B 21/20 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 17/30 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01B 21/20 (2013.01); G06K 9/00214 (2013.01); G06K 9/6211 (2013.01); G06T 7/0032 (2013.01); G06T 17/30 (2013.01); G06T 19/20 (2013.01); G06T 2200/08 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30164 (2013.01); G06T 2210/56 (2013.01);
Abstract

Method of measuring a point cloud of an object includes obtaining the point cloud of the object from a storage device of the electronic device. Based on the point cloud, a triangular mesh surface is constructed and triangles of the triangular mesh surface are determined. According to the triangles, a reference plane is determined. According to the reference plane, a three dimensional (3D) object coordinate system is established. 3D object coordinates of points in the point cloud are calculated in the 3D object coordinate system. Measurement elements of a profile of the point cloud are determined and points in the point cloud corresponding to each of the measurement elements are determined. According to the 3D object coordinates of the determined points corresponding to each of the measurement elements, each of the measurement elements are fit. A distance and an angle of two fit measurement elements are calculated.


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