The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Mar. 28, 2011
Naren Chittar, San Jose, CA (US);
Sanjay Pundlkrao Ghatare, San Jose, CA (US);
Richard D. Henderson, San Jose, CA (US);
Ryan Mcdonald, San Francisco, CA (US);
John Roper, Sammamish, WA (US);
Naren Chittar, San Jose, CA (US);
Sanjay Pundlkrao Ghatare, San Jose, CA (US);
Richard D. Henderson, San Jose, CA (US);
Ryan McDonald, San Francisco, CA (US);
John Roper, Sammamish, WA (US);
eBay Inc., San Jose, CA (US);
Abstract
Using a processor, receiving, a query including a query image. A database is searched for a set of images similar to the query image, using a two-pass search. The results of the searching are then provided, the results including image members of the set of images similar to the query image. The first pass may be performed using a TF-IDF algorithm and the second pass ranks a predetermined number of results from the first pass by a best match algorithm or other type of algorithm. The type of second pass algorithm may be selectable by a user. If an end signal is not detected, a further two-pass search may be made based on a subsequent query having a subsequent query image. The subsequent query image may be one of the results of the previous two pass search. A subsequent query image may change from an image of a product of a first product category to an image of a product of a second product category.