The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Jun. 12, 2015
Applicant:
Hcl Technologies Ltd., Chennai, Tamil Nadu, IN;
Inventors:
Arivukarasu Sivanesan, Chennai, IN;
Ambica Jain, Noida, IN;
Johnson Selwyn, Chennai, IN;
S U M Prasad Dhanyamraju, Hyderabad, IN;
Assignee:
HCL Technologies Ltd., Chennai, IN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01);
Abstract
Generating an optimized test suite for use in a software testing environment. This invention relates to software testing systems, and more particularly to generating an optimized test suite for using in a software testing system. The principal object of this invention is to propose a method and system for generation of an optimized test suite using a sequential process with a combination of custom and generic optimization techniques.