The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Dec. 20, 2013
Emc Corporation, Hopkinton, MA (US);
Robert P. Foley, Clinton, MA (US);
Daniel E. Cummins, Hudson, NH (US);
Peter Puhov, Shrewsbury, MA (US);
David W. Harvey, Newton, MA (US);
Marc C. Cassano, Medway, MA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
A method, computer program product, and computing system for sensing the occurrence of an degraded condition within a data stripe of a RAID array. The data strip includes one or more valid data portions, one invalid data portion, and a parity portion. A request to write updated content to a target data portion within the data stripe is received, wherein the target data portion is one of the valid data portions. The valid data portions and the parity portion are read from the data stripe. The invalid data portion is reconstructed using the valid data portions and the parity portion, thus generating a reconstructed data portion. The reconstructed data portion is stored within a mirrored cache memory system. The parity portion is updated to define the updated content, thus defining an updated parity portion. The updated parity portion is written to the data stripe and the updated content is written to the target data portion within the data stripe.