The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Feb. 24, 2014
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Yuusuke Kobayashi, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/0706 (2013.01); G06F 11/076 (2013.01); G06F 11/0772 (2013.01);
Abstract

Disclosed is a fault repair apparatus capable of reducing time which fault repair processing needs. The fault repair apparatus according to an exemplary aspect of the invention includes, a detection unit that detects a fault in the integrated circuit being equipped with a memory storing configuration data (config-data), and a circuit element whose logic operation is defined by the config-data; and outputs fault information; a memory unit that memorizes a fault area specification table which correlates whether or not a description in the config-data related to the fault information exists in any of memory areas to identification information which identifies the memory area; a specification unit that specifies a failed memory area from the fault information and the fault area specification table; and a correction unit that, about the config-data stored in the failed memory area, detects and corrects error data which does not agree with an expected value.


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