The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Apr. 15, 2014
Applicant:

Apple Inc., Cupertino, CA (US);

Inventor:

Nitin Bhargava, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/12 (2006.01); G06F 9/45 (2006.01); G06F 11/00 (2006.01); G01R 31/317 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/00 (2013.01); G01R 31/31705 (2013.01); G06F 11/22 (2013.01);
Abstract

An integrated circuit (IC) having a debug access port coupled to a processing circuit without a dedicated sideband interface is disclosed. In one embodiment, an IC includes a processor circuit and a DAP. The IC also includes a communications fabric over which communications transactions may be conveyed between the various functional circuits of the IC using a fabric protocol. Both the DAP and the processing circuit are coupled to the communications fabric. The IC also includes a translation circuit coupled between the processing circuit and the communications fabric. The translation circuit may translate transactions conveyed between the processing circuit and the DAP from or to a debug protocol to or from the fabric protocol. Thus, the DAP and the processing circuit may communicate according to the debug protocol without a dedicated sideband coupled therebetween.


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