The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Feb. 28, 2013
Applicant:

Shiseido Company, Ltd., Tokyo, JP;

Inventors:

Yoshimasa Miura, Kanagawa, JP;

Sayaka Suzuki, Kanagawa, JP;

Naruhito Toyoda, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/041 (2006.01); G06F 3/0354 (2013.01); G01N 17/00 (2006.01); G01L 25/00 (2006.01); G01L 1/20 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0414 (2013.01); G01L 1/205 (2013.01); G01L 25/00 (2013.01); G01N 17/004 (2013.01); G06F 3/03547 (2013.01);
Abstract

An application operation evaluating apparatus, includes a detecting unit that detects pressing force obtained by a plurality of sensors provided at an application target surface in accordance with an application operation to the application target surface; an estimating unit that estimates a pressed position of the application operation on the application target surface based on pressing forces respectively applied to the sensors obtained by the detecting unit; a load distribution generating unit that generates load distribution in accordance with the application operation based on the pressing force obtained by the detecting unit and the pressed position obtained by the estimating unit; and a display unit that displays the load distribution obtained by the load distribution generating unit on a screen.


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