The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Apr. 01, 2013
Ahmed Al-muthana, Dhahran, SA;
Gabor Hursan, Dhahran, SA;
Shouxiang MA, Dhahran, SA;
Philip M. Singer, Richmond, TX (US);
Benjamin Nicot, Rio De Janeiro, BR;
Andrea Valori, Al-Khobar, SA;
Farhan Ali, Dammam, SA;
Henry N. Bachman, Missouri City, TX (US);
Ahmed Al-Muthana, Dhahran, SA;
Gabor Hursan, Dhahran, SA;
Shouxiang Ma, Dhahran, SA;
Philip M. Singer, Richmond, TX (US);
Benjamin Nicot, Rio De Janeiro, BR;
Andrea Valori, Al-Khobar, SA;
Farhan Ali, Dammam, SA;
Henry N. Bachman, Missouri City, TX (US);
SCHLUMBERGER TECHNOLOGY CORPORATION, Sugar Land, TX (US);
SAUDI ARAMCO, Dhahran, SA;
Abstract
Methods are described for wettability characterization based on NMR measurements, which are sensitive to the surface wetting conditions of oil and water at the pore scale. The described methods make use of surface relaxation effects on the NMR relaxation (T). Workflows are described to obtain wettability profiles of a porous media such as a rock either in the native state or prepared to a certain state in the laboratory. An underlying forward model is also described for the mixed wet and fractionally saturated pore spectrum. Outputs of the described inversion include continuous saturation and wettability profiles as a function of the pore sizes in the porous media, as well as an averaged value for saturation and wettability over the entire pore spectrum.