The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
May. 15, 2014
Applicants:
Centre National DE LA Recherche Scientifique, Paris, FR;
Universite Joseph Fourier, Grenoble, FR;
Inventors:
Yannick Arnoud, Saint Egreve, FR;
Olivier Guillaudin, Claix, FR;
Assignees:
Centre National de la Recherche Scientifique, Paris, FR;
Universite Grenoble Alpes, Saint Martin d'Heres, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/185 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2935 (2013.01);
Abstract
The invention relates to a matrix device for measuring characteristics of an X-ray beam. The device includes a first set of detection cells of a size different from the cells of at least one second set of detection cells. Each cell corresponds to an ionization chamber including a detection electrode. The detection electrodes of all the cells have the same effective surface for collecting charges.