The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
May. 07, 2012
Nathan S. White, San Diego, CA (US);
Anders M. Dale, La Jolla, CA (US);
Nathan S. White, San Diego, CA (US);
Anders M. Dale, La Jolla, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
Methods, devices and systems are disclosed for measuring biological tissue parameters using restriction spectrum magnetic resonance imaging. In one aspect, a method of characterizing a biological structure includes determining individual diffusion signals from magnetic resonance imaging (MRI) data in a set of MRI images that include diffusion weighting conditions (e.g., diffusion gradient directions, diffusion gradient strengths, sensitivity factors (b-values), or diffusion times), combining the individual diffusion signals to determine a processed diffusion signal corresponding to at least one location within one or more voxels of the MRI data, calculating one or more parameters from the processed diffusion signal by using the diffusion weighting conditions, and using the one or more parameters to identify a characteristic of the biological structure, in which the one or more parameters include values over a range of one or more diffusion length scales based on at least one of diffusion distance or diffusion rate.