The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Feb. 12, 2014
The Boeing Company, Seal Beach, CA (US);
Edward L. Puckett, Renton, WA (US);
Andrej M. Savol, Lake Tapps, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Disclosed non-destructive inspection methods comprise non-contact determination of the location of a non-destructive inspection probe and identification of the location on a test structure where test data is acquired by the probe. Determination may include capturing the positions of the probe and the test structure with one or more electronic cameras. Identification may include associating the acquired test data with the location of the probe relative to the test structure. Further, methods may comprise visualization of the test data relative to the identified location. Disclosed non-destructive inspection systems comprise a probe, one or more electronic cameras, a computer, and a display, together configured to determine the location of the probe, to acquire test data with the probe, to identify a location on a test structure associated with the test data, and to visualize the test data in relation to the test structure.