The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9404839 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 02, 2016

Filed:

Dec. 18, 2014
Applicants:

Allen Hagerman Reed, Bay Saint Louis, MS (US);

Hang Yin, Baton Rouge, LA (US);

David C. Young, Long Beach, MS (US);

Guoping Zhang, Hadley, MA (US);

Inventors:

Allen Hagerman Reed, Bay Saint Louis, MS (US);

Hang Yin, Baton Rouge, LA (US);

David C. Young, Long Beach, MS (US);

Guoping Zhang, Hadley, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01); G01N 3/06 (2006.01); G01N 33/24 (2006.01);
U.S. Cl.
CPC ...
G01N 3/08 (2013.01); G01N 3/068 (2013.01); G01N 33/24 (2013.01); Y10T 29/49826 (2015.01);
Abstract

Apparatus and methods for testing sediment submerged in liquid and manufacturing the apparatus. The apparatus and methods of the present embodiment can provide for nano/micro characterization of mechanical properties of materials submerged in liquid, facilitating specimen preparation and installation, and can provide hydrated materials. The apparatus can include cell walls with optical magnifying lenses so that the materials can be viewed without the aid of a microscope.


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