The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Oct. 27, 2014
Alexander M. Barry, Cypress, TX (US);
Karl Kai Ku, Sugar Land, TX (US);
Ian Mitchell, Radford, VA (US);
William Johnston, Blacksburg, VA (US);
Alexander M. Barry, Cypress, TX (US);
Karl Kai Ku, Sugar Land, TX (US);
Ian Mitchell, Radford, VA (US);
William Johnston, Blacksburg, VA (US);
Baker Hughes Incorporated, Houston, TX (US);
Abstract
An apparatus for performing a measurement of a downhole property includes an optical fiber having a first section that has a first set of fiber Bragg gratings with a first resonant wavelength inscribed therein and a second section that has a second set of fiber Bragg gratings with a second resonant wavelength different from the first resonant wavelength inscribed therein. The second section is in series with the first section. An optical interrogator emits a swept-wavelength frequency domain light signal having varying wavelength amplitude modulation into the optical fiber, receives a frequency domain return light signal, and transforms the frequency domain return signal into a time domain to determine a resonant wavelength shift of each fiber Bragg grating and the corresponding location of each interrogated fiber Bragg grating. A processor converts the resonant wavelength shift of each interrogated fiber Bragg grating into the downhole property measurement.