The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Oct. 22, 2012
Applicant:
Tetsuya Yamaguchi, Nagoya, JP;
Inventor:
Tetsuya Yamaguchi, Nagoya, JP;
Assignee:
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota-shi, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/02 (2006.01); G01L 19/00 (2006.01); G01M 3/34 (2006.01); G01M 3/32 (2006.01);
U.S. Cl.
CPC ...
G01M 3/02 (2013.01); G01L 19/0092 (2013.01); G01M 3/025 (2013.01); G01M 3/3263 (2013.01); G01M 3/34 (2013.01);
Abstract
A leak test method includes: reducing first pressure in an inspection space in a work and second pressure in a space in a master chamber; humidifying the inspection space in the work; and detecting a change in differential pressure between the inspection space in the work and the space in the master chamber, while the inspection space in the work is in a water-vapor saturated state. Also, in this leak test method, a leak in the inspection space in the work is detected from the change in the differential pressure.