The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Jun. 21, 2013
Azbil Corporation, Tokyo, JP;
Tomoki Hosoi, Tokyo, JP;
Mitsuhiro Honda, Tokyo, JP;
AZBIL CORPORATION, Tokyo, JP;
Abstract
A detected temperature acquiring portion acquires detected temperatures from individual thermopile array sensors, a temperature change comparing portion compares changes in detected temperatures over time, for each respective location, between test locations selected from a overlapping region and individual comparing locations for two thermopile array sensors wherein planned detecting ranges partially overlap each other, to identify a best match location, a factor estimating portion, for each test location, generates an equation indicating a relationship between the best match location and positional shift factors, and establishes these equations as a system and solves the system of equations through a least-squares method to estimate the positional shift factors, and a detecting range identifying portion corrects location coordinates of the planned detecting ranges based on these positional shift factors to identify actual detecting ranges.