The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Oct. 10, 2014
Applicant:
The University of Hong Kong, Hong Kong, CN;
Inventors:
Kenneth Kin Yip Wong, Hong Kong, CN;
Chi Zhang, Hong Kong, CN;
Assignee:
THE UNIVERSITY OF HONG KONG, Hong Kong, CN;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01J 3/28 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/28 (2013.01); G01B 9/02004 (2013.01); G01B 9/02044 (2013.01); G01B 9/02091 (2013.01); G01B 9/02097 (2013.01);
Abstract
Systems and methods for non-invasive optical imaging are provided. One or more time-lenses can be utilized to perform an optical Fourier transform, and the time-to-wavelength conversion can generate a wavelength-encoded image of optical scattering, analogous to optical coherence tomography. This optical Fourier transform provides improved axial resolution and simplifies digital signal processing after data acquisition.