The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Dec. 03, 2013
Applicant:
Integrated Plasmonics Corporation, San Francisco, CA (US);
Inventor:
Robert Joseph Walters, San Francisco, CA (US);
Assignee:
INTEGRATED PLASMONICS CORPORATION, San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01J 3/02 (2006.01); G01J 3/42 (2006.01); G02B 5/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0229 (2013.01); G01J 3/0208 (2013.01); G01J 3/42 (2013.01); G01N 21/64 (2013.01); G02B 5/008 (2013.01);
Abstract
A spectroscopic measurement system, which may utilize multiple plasmonic filters associated with a cuvette to monitor different wavelengths of light. The spectroscopic measurement system may measure absorbance and or fluorescence, and may have built-in low cost CMOS image sensor(s). Reagents and samples may be introduced to the cuvette from a fluidics manifold. Multiple sets of combined cuvettes, image sensors and plasmonic filters may utilize a single fluidics manifold for reagent and sample distribution.