The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Aug. 09, 2012
Stéphane Gaillot, Vinon sur Verdon, FR;
Nicolas Regazzoni, Aix en Provence, FR;
Guy Cheymol, Bures sur Yvette, FR;
Stéphane Gaillot, Vinon sur Verdon, FR;
Nicolas Regazzoni, Aix en Provence, FR;
Guy Cheymol, Bures sur Yvette, FR;
Abstract
Deformation measurement sensor operating in a hostile environment and including an optical movement measurement module, and measurement system using said sensor. The sensor includes: an enclosure comprising an opening; a movable element having a first surface that is brought into contact with an object (4) that can deform, for example a nuclear fuel rod, and a second surface that is reflective and extends into the enclosure through the opening; a sealed, resilient connecting component performing a return function between the element and the enclosure; and, inside the enclosure, a module for creating an interference light using a light reflected by the second surface of the element. Deformation of the object results in a modification to the interference light that is representative of the deformation.