The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Jan. 24, 2013
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Yasuhiro Kabetani, Osaka, JP;

Tomotaka Furuta, Osaka, JP;

Nobuo Hara, Osaka, JP;

Shohei Aoki, Osaka, JP;

Seiji Hamano, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01B 11/00 (2006.01); G01B 9/02 (2006.01); G01N 21/47 (2006.01); G01N 21/89 (2006.01); H01M 10/04 (2006.01); B65H 39/16 (2006.01); B65H 18/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); G01B 9/02004 (2013.01); G01B 9/02091 (2013.01); G01B 11/00 (2013.01); G01N 21/4795 (2013.01); G01N 21/8901 (2013.01); H01M 10/0409 (2013.01); B65H 18/00 (2013.01); B65H 39/16 (2013.01); Y10T 29/4911 (2015.01); Y10T 29/49119 (2015.01);
Abstract

Provided is a winding apparatus that is provided with a splitter that splits radiant light from a light source unit into measurement light applied to a side face part of a first sheet and a second sheet and reference light applied to a reference surface, an interference detector that detects interference light formed by interference between the reference light reflected by the reference surface and the measurement light reflected by the side face part, a position detector that detects the position of the first sheet and the position of the second sheet on the basis of the detected interference light, and a decision processor that decides the quality of the wound body on the basis of the detected positions of the first sheet and the second sheet.


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