The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Dec. 21, 2010
Applicants:
James G. Nadeau, Ellicott City, MD (US);
Bernard J. H. Verwer, Phoenix, MD (US);
Inventors:
James G. Nadeau, Ellicott City, MD (US);
Bernard J. H. Verwer, Phoenix, MD (US);
Assignee:
Becton, Dickinson and Company, Franklin Lakes, NE (US);
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/689 (2013.01); C12Q 2600/16 (2013.01);
Abstract
Presented herein are methods for the detection of the presence or absence of one or more microorganisms in a sample. The method deploys a plurality of probe sets to detect a plurality of microorganisms. The probes in the probe set are detectably labeled. At least one probe set has probes labeled with a combination of detectable labels. The number of detectable labels used in the plurality of probe sets numbers less than the number of microorganisms being detected by the probe set.