The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Jan. 28, 2013
Heye International Gmbh, Ombernkirchen, DE;
Michael Kellner, Bad Salzuflen, DE;
Ralf Schottelndreier, Nienstadt, DE;
Kai Bindewald, Stadthagen, DE;
Roland Fiedler, Laasdorf, DE;
HEYE INTERNATIONAL GMBH, Obernkirchen, DE;
Abstract
In a method for controlling the process parameters of a machine for producing hollow glass articles, the shape of the produced hollow glass article is measured online by means of at least one camera immediately after its shaping. Deviations from a reference shape are detected, and these deviations are used as the basis of the control. The control is a storage medium that contains a mechanical model describing the functional correlation between a certain pattern of a deformation of the hollow glass article and an adjustment of process parameters. An intervention in the adjustments of process parameters is carried out in accordance with the type of deformation detected.