The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2016
Filed:
Mar. 07, 2014
Mediatek Singapore Pte, Ltd., Singapore, SG;
Ying Chow Tan, Singapore, SG;
Tieng Ying Choke, Singapore, SG;
Yuan Sun, Singapore, SG;
Osama K A Shana'a, Singapore, SG;
MediaTek Singapore Pte. Ltd., Singapore, SG;
Abstract
A method for testing an Integrated Circuit (IC) with Near Field Communication (NFC) technology according to a first embodiment of the present invention includes: utilizing a BB modem of the IC to generate a known data pattern; modulating the known data pattern to generate a modulated data pattern; sending the modulated data pattern on the transmitting path to an NFC antenna of the IC and utilizing the NFC antenna to loop the modulated data pattern back to the receiving path; demodulating the modulated data pattern; and determining if the data pattern on the transmitting path is the same as the data pattern on the receiving path. When the data pattern on the transmitting path is not the same as the data pattern on the receiving path, it is determined that the IC fails.