The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2016

Filed:

May. 18, 2015
Applicants:

Olivier Vincent Doare, La Salvetat St Gilles, FR;

Rex Kenton Hales, Mesa, AZ (US);

Inventors:

Olivier Vincent Doare, La Salvetat St Gilles, FR;

Rex Kenton Hales, Mesa, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 3/00 (2006.01);
U.S. Cl.
CPC ...
H03M 3/378 (2013.01); H03M 3/39 (2013.01);
Abstract

The test signal generator generates an analog and digital test signals to test a sigma-delta ADC which has an analog portion succeeded by a digital decimation filter. The test signal generator supplies a first digital test signal having a first particular number of bits N and a first particular bit rate RN corresponding to digital signals occurring after the digital decimation filter. A digital sigma-delta modulator converts the first digital test signal into a second digital test signal having a second particular number of bits M<N thereby corresponding to a digital signal occurring at an input of the digital decimation filter. A DAC converts the second digital test signal into an analog signal, and a filter to filter the analog signal to obtain an analog test signal for testing the analog portion.


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