The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2016
Filed:
Mar. 08, 2009
Gregory J. Fountain, Kalamazoo, MI (US);
Harry M. Gilbert, Portage, MI (US);
Randy L. Mayes, Otsego, MI (US);
Oleksiy Portyanko, Kalamazoo, MI (US);
Olav M. Underdal, Kalamazoo, MI (US);
William W. Witliff, Iii, Gobles, MI (US);
Gregory J. Fountain, Kalamazoo, MI (US);
Harry M. Gilbert, Portage, MI (US);
Randy L. Mayes, Otsego, MI (US);
Oleksiy Portyanko, Kalamazoo, MI (US);
Olav M. Underdal, Kalamazoo, MI (US);
William W. Witliff, III, Gobles, MI (US);
Bosch Automotive Service Solutions Inc., Warren, MI (US);
Abstract
A method for optimizing a test sequence to diagnose a failure mode of a device, such as a vehicle, is provided. At least one symptom of a fault of the device is received, and a plurality of taxonomies is generated. The taxonomies include a device component taxonomy, a fault taxonomy, and a diagnostic taxonomy, and each taxonomy has a plurality of nodes. At least one diagnostic test sequence, based on the symptom and the taxonomies, is generated, costs associated with the diagnostic test sequence are determined, and a cost optimal test sequence, based on the costs and the diagnostic test sequence, is generated.