The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2016

Filed:

Feb. 10, 2015
Applicant:

The Research Foundation for the State University of New York, Albany, NY (US);

Inventor:

Arie E. Kaufman, Plainview, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/10 (2006.01); G06T 11/00 (2006.01); G06T 15/04 (2011.01);
U.S. Cl.
CPC ...
G06T 17/10 (2013.01); G06T 11/001 (2013.01); G06T 15/04 (2013.01);
Abstract

Provided is a method for obtaining a conformal mapping of first image data corresponding to a source mesh to a target mesh, by generating a template of the source mesh and a template of the target mesh, processing the generated source mesh template and the generated target mesh template to obtain a conformal mapping from the source mesh to the target mesh, mapping the first image data corresponding to the source mesh to second image data corresponding to the target mesh according to the obtained conformal mapping, and outputting a mapped texture corresponding to the mapped second image data to the display corresponding to the target mesh.


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