The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2016
Filed:
Sep. 25, 2013
Oracle International Corporation, Redwood City, CA (US);
Timothy Craig Ostwald, Boulder, CO (US);
Terry L. Lane, Broomfield, CO (US);
ORACLE INTERNATIONAL CORPORATION, Redwood City, CA (US);
Abstract
Systems and methods are described for automatic calibration of robotic mechanism functions according to accurate decoding and locating of target features using spot scanning. For example, a robotic mechanism in a storage library has one or more integrated scanners that can acquire contrast and/or topographic scan data from a scan window that represents a profile of the scan window expected to have one or more target feature sets. The scan data can be decoded according to predefined target masks (e.g., target type-specific fit tables) at a number of decode threshold levels to estimate target feature values, which can be used to converge on (or otherwise generate) a purported target definition with purported feature values. The purported target definition can be used to facilitate various functions, such as automatic calibration of robotic mechanism positioning and object identification.