The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2016
Filed:
Aug. 31, 2011
Daniel Kurz, Munich, DE;
Peter Meier, Munich, DE;
Daniel Kurz, Munich, DE;
Peter Meier, Munich, DE;
Metaio GmbH, Munich, DE;
Abstract
A method of matching image features with reference features comprises the steps of providing a current image, providing a set of reference features, wherein each of the reference features comprises at least one first parameter which is at least partially indicative of a position and/or orientation of the reference feature with respect to a global coordinate system, wherein the global coordinate system is an earth coordinate system or an object coordinate system, or at least partially indicative of a position of the reference feature with respect to an altitude, detecting at least one feature in the current image in a feature detection process, associating with the detected feature at least one second parameter which is at least partially indicative of a position and/or orientation of the detected feature, or which is at least partially indicative of a position of the detected feature with respect to an altitude, and matching the detected feature with a reference feature by determining a similarity measure.