The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2016

Filed:

Apr. 13, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Chung-Ching Lin, White Plains, NY (US);

Sharathchandra U. Pankanti, Darien, CT (US);

John R. Smith, New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 3/40 (2006.01); G06K 9/62 (2006.01); G06T 7/40 (2006.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06K 9/52 (2013.01); G06K 9/6203 (2013.01); G06T 3/4038 (2013.01); G06T 7/40 (2013.01); G06T 7/408 (2013.01); G06T 2200/32 (2013.01);
Abstract

A system, method and computer program product for relating corresponding points in images with an overlapping scene. An example method includes generating transformed images of a target image using different image transformations for each of transformed images. Texture descriptors are extracted for feature points in the transformed images and a reference image. Matched feature points are identified and inliers from matched feature points are selected. An aligning transformation is generated using the inliers for at least one of the transformed images. A panorama image is created with the target image and reference image after the images are aligned.


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