The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2016

Filed:

May. 20, 2014
Applicant:

Wistron Corp., New Taipei, TW;

Inventors:

Chin-Lun Lai, New Taipei, TW;

Jun-Horng Chen, New Taipei, TW;

Chih-Hong Chu, New Taipei, TW;

Shu-Chen Li, New Taipei, TW;

Jing-Ying Hsu, New Taipei, TW;

Assignee:

WISTRON CORP., New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00899 (2013.01); G06K 9/00288 (2013.01); G06K 9/00617 (2013.01);
Abstract

An identification method and an apparatus utilizing the method are disclosed. The disclosed method comprises capturing a first examining image at a first direction, performing a face detection process on the first examining image to identify a first face image in the first examining image, detecting a number of straight lines which are within a detecting image block of the first examining image but outside the first face image, comparing the number of straight lines with a quantity threshold to obtain a first judgment value, and judging if the first face image pass an examination at least according to the first judgment value.


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