The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2016
Filed:
Sep. 25, 2014
Qualcomm Incorporated, San Diego, CA (US);
Mark Leo Moeglein, Ashland, OR (US);
Christopher Brunner, San Diego, CA (US);
Hui Chao, San Jose, CA (US);
Murali Ramaswamy Chari, San Diego, CA (US);
Arvind Ramanandan, San Diego, CA (US);
Mahesh Ramachandran, San Jose, CA (US);
Abhishek Tyagi, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Embodiments disclosed obtain a plurality of measurement sets from a plurality of sensors in conjunction with the capture of a sequence of exterior and interior images of a structure while traversing locations in and around the structure. Each measurement set may be associated with at least one image. An external structural envelope of the structure is determined from exterior images of the structure and the corresponding outdoor trajectory of a UE. The position and orientation of the structure and the structural envelope is determined in absolute coordinates. Further, an indoor map of the structure in absolute coordinates may be obtained based on interior images of the structure, a structural envelope in absolute coordinates, and measurements associated with the indoor trajectory of the UE during traversal of the indoor area to capture the interior images.