The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2016
Filed:
Aug. 22, 2014
Applicant:
Becton, Dickinson and Company, Franklin Lakes, NJ (US);
Inventors:
Nicholas Bachur, Jr., Monkton, MD (US);
John Neubert, Westminster, MD (US);
Assignee:
Becton, Dickinson and Company, Franklin Lakes, NJ (US);
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01); G01N 33/487 (2006.01); G01N 27/22 (2006.01); B01L 7/00 (2006.01); C12M 1/42 (2006.01); C12N 13/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/48735 (2013.01); B01L 7/52 (2013.01); C12M 35/02 (2013.01); C12N 13/00 (2013.01); G01N 27/22 (2013.01); G01N 27/221 (2013.01);
Abstract
A system and method is provided for non-invasively measuring changes in a specimen suspected of containing one or more microbes, by monitoring changes in the dielectric constant of the specimen caused by metabolic processes of such microbes.