The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2016
Filed:
Feb. 20, 2014
Kabushiki Kaisha Toshiba, Tokyo, JP;
Setsu Yamamoto, Yokohama, JP;
Jun Semboshi, Yokohama, JP;
Masahiro Yoshida, Chigasaki, JP;
Takahiro Miura, Yokohama, JP;
Kazumi Watanabe, Yokohama, JP;
Makoto Ochiai, Yokohama, JP;
Satoshi Nagai, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
An ultrasonic test equipment includes: a signal generating mechanism that generates a voltage waveform; an ultrasonic transmitting mechanism that excites ultrasonic vibrations having a lower frequency than a predetermined frequency to an object to be tested; an ultrasonic receiving mechanism that receives an ultrasonic response from the object to be tested; an AD converting mechanism that digitizes the received ultrasonic waveform; an analyzing mechanism that performs frequency analysis of the digital ultrasonic waveform digitized by the AD converting mechanism; an evaluating mechanism that extracts a variation of a nonlinear ultrasonic component from a frequency component of the digital ultrasonic wave obtained by the frequency analysis, compares the variation with defect data information in a defect information database, identifies a physical quantity of defect information of the object to be tested, and evaluates a defect in the object to be tested; and a control mechanism that partly or entirely controls a measurement system.