The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2016
Filed:
May. 20, 2015
Applicant:
Sony Corporation, Tokyo, JP;
Inventor:
Nao Nitta, Tokyo, JP;
Assignee:
Sony Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); G01N 21/64 (2006.01); G01N 15/14 (2006.01); G01N 21/27 (2006.01); G01N 15/10 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6486 (2013.01); G01N 15/1429 (2013.01); G01N 15/1434 (2013.01); G01N 15/1459 (2013.01); G01N 21/274 (2013.01); G01N 21/64 (2013.01); G01N 21/645 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/1006 (2013.01); G01N 2021/6417 (2013.01); G01N 2201/06113 (2013.01);
Abstract
A fine particle measuring apparatus is provided. The fine particle measuring apparatus includes a detection unit configured to detect light emitted from a fine particle and a processing unit having a memory device storing instructions which when executed by the processing unit, cause the processing unit to calculate a corrected intensity value of the detected light and generate spectrum data based on the corrected intensity value.