The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2016
Filed:
Aug. 31, 2012
Yoshimi Matsumoto, Suita, JP;
Kohei Hayama, Suita, JP;
Shouichi Sakakihara, Suita, JP;
Kunihiko Nishino, Suita, JP;
Akihito Yamaguchi, Suita, JP;
Hiroyuki Noji, Tokyo, JP;
Ryota Iino, Tokyo, JP;
Yoshimi Matsumoto, Suita, JP;
Kohei Hayama, Suita, JP;
Shouichi Sakakihara, Suita, JP;
Kunihiko Nishino, Suita, JP;
Akihito Yamaguchi, Suita, JP;
Hiroyuki Noji, Tokyo, JP;
Ryota Iino, Tokyo, JP;
Osaka University, Osaka, JP;
FUKOKU Co., Ltd., Saitama, JP;
Abstract
The present disclosure describes a method capable of easily and rapidly inspecting the susceptibility of bacteria or fungi to an antimicrobial drug. The inspection method of the present disclosure is a method for inspecting susceptibility of bacteria or fungi to an antimicrobial drug using a micro-device having flow channels, including: incubating a mixture of the antimicrobial drug and a suspension to be inspected in the flow channels of the micro-device; and detecting bacteria or fungi derived from the suspension to be inspected in an observation area of the flow channels of the micro-device. The detecting step can be performed by detecting an increase or decrease in the number of or a change in shape of bacteria or fungi derived from the suspension to be inspected in the observation area by a microscope or the like.