The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2016
Filed:
Jan. 30, 2014
GE Medical Systems Global Technology Company, Llc, Waukesha, WI (US);
Jiaqin Dong, Beijing, CN;
Shuo Li, Beijing, CN;
Jun Li, Sichuan, CN;
Ximiao Cao, Beijing, CN;
Bin Wang, Sichaun, CN;
GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY COMPANY, LLC, Waukesha, WI (US);
Abstract
A method for geometric calibration of a CT scanner, including, for each row of at least one row of detector cells, establishing a complete geometric description of the CT scanner, including at least one unknown geometric parameter, establishing a description of a forward projection function using the complete geometric description, acquiring actual projection coordinates of a calibration phantom placed in a scanning field of view (SFOV) on a current row of detector cells and corresponding to a plurality of angles, acquiring calculated projection coordinates of the calibration phantom on the current row of detector cells and corresponding to the plurality of angles using the description of the forward projection function, and acquiring a calibrated value for the at least one unknown geometric parameter by evaluating the at least one unknown geometric parameter based on the acquired actual projection coordinates and calculated projection coordinates via a nonlinear least square fitting algorithm.