The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Feb. 23, 2015
Qualcomm Incorporated, San Diego, CA (US);
Feilu Liu, San Diego, CA (US);
Joshua Tennyson MacDonald, Superior, CO (US);
Srivatsa Venkata Chivukula, San Diego, CA (US);
Vani Chaitanya Ginnela, College Station, TX (US);
Shyamal Ramachandran, San Diego, CA (US);
Aziz Gholmieh, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Aspects disclosed herein relate to determining frequencies for measuring cells in reselection. A set of frequencies over which to measure cells for reselection can be prioritized, wherein one or more first frequencies in the set of frequencies correspond to frequencies of previously visited closed subscriber group (CSG) cells, multimedia broadcast multicast services (MBMS) frequencies, etc. A command to deprioritize one or more second frequencies for reselection can be received, and it can be determined whether to deprioritize the one or more second frequencies in the prioritized set of frequencies based at least in part on the command. One or more cells can be measured over the prioritized set of frequencies based at least in part on respective priorities of the set of frequencies and may be evaluated for reselection.