The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Jul. 13, 2012
Applicants:

Patrick Haldner, Schaan, LI;

Christoph Wuersch, Werdenberg, CH;

Wilfried Kaneider, Rankweil, AT;

Dietmar Schoenbeck, Goefis, AT;

Sascha Korl, Buchs, CH;

Inventors:

Patrick Haldner, Schaan, LI;

Christoph Wuersch, Werdenberg, CH;

Wilfried Kaneider, Rankweil, AT;

Dietmar Schoenbeck, Goefis, AT;

Sascha Korl, Buchs, CH;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01); G01R 29/12 (2006.01); H04N 5/232 (2006.01); G01V 3/165 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23296 (2013.01); G01V 3/165 (2013.01);
Abstract

A method and device for detecting an object in a substrate is disclosed. The device has a sensor unit having a sensor element and at least one further sensor element, a control and evaluation unit, and a display unit. The method for detecting an object in a substrate includes simultaneous reception of a receive signal and at least one further receive signal and simultaneous calculation of a depth cross-sectional image from the receive signal and at least one further depth cross-sectional image from the at least one further receive signal by the control and evaluation unit.


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