The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Nov. 06, 2013
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Angelo M. Puzella, Marlborough, MA (US);
Jeffrey C. Upton, Groton, MA (US);
Arsenio Vargas, Shrewsbury, MA (US);
Steven D. Nguyen, Lowell, MA (US);
Kassam K. Bellahrossi, Pelham, NH (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); H04B 17/21 (2015.01); H01Q 25/02 (2006.01); H01Q 3/26 (2006.01); H01Q 21/00 (2006.01); G01S 7/03 (2006.01); G01S 13/44 (2006.01);
U.S. Cl.
CPC ...
H04B 17/21 (2015.01); G01S 7/032 (2013.01); G01S 13/4463 (2013.01); H01Q 3/26 (2013.01); H01Q 21/0025 (2013.01); H01Q 21/0093 (2013.01); H01Q 25/02 (2013.01);
Abstract
Described is a calibration technique for an Active Electronically Scanned Array (AESA) having a scalable, analog monopulse network.