The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Jul. 23, 2013
Zte Corporation, Shenzhen, Guangdong, CN;
ZTE CORPORATION, Shenzhen, Guangdong, CN;
Abstract
A method for detecting an optical signal-to-noise ratio (OSNR). A wavelength label loading end () loads a wavelength label signal in an optical signal, and sends a loading modulation depth of the wavelength label signal to an OSNR detection end () through a wavelength label channel or an optical monitoring channel. The OSNR detection end () obtains a loading modulation depth of a wavelength label signal loaded in each wavelength optical signal, parses the wavelength label signal to obtain a current modulation depth of the wavelength label signal, and obtains an OSNR value of each wavelength optical signal according to the loading modulation depth and the current modulation depth of the wavelength label signal. A system and device for detecting an OSNR applicable to OSNR tests of present optical signals with high rates of 40 G, 100 G, etc., and in particular to OSNR tests of polarization multiplexing optical signals.